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【英文标准名称】:Specificationforharmonizedsystemofqualityassessmentforelectroniccomponents-Semiconductordiscretedevices-Blankdetailspecification-Ambient-ratedbipolartransistorsforlowandhigh-frequencyamplification
【原文标准名称】:电子元器件质量评估的协调体系.半导体分立器件.空白详细规范.低频和高频放大用环境温度额定双极晶体管
【标准号】:BSQC750102-1990
【标准状态】:作废
【国别】:英国
【发布日期】:1990-02-15
【实施或试行日期】:1990-02-15
【发布单位】:英国标准学会(GB-BSI)
【起草单位】:BSI
【标准类型】:()
【标准水平】:()
【中文主题词】:半导体器件;检验;质量保证体系;规范(验收);认可试验;电子设备及元件;试验条件;晶体管;详细规范;资格鉴定;质量评估;质量评估;评估的质量;双极晶体管
【英文主题词】:Amplifiers;Bipolar;Bipolartransistors;Blankforms;Components;Controlcharts;Detailspecification;Electricalengineering;Electronicengineering;Electronicequipmentandcomponents;Environment;Forms(paper);Highfrequencies;Integratedcircuits;Limits(mathematics);Lowfrequencies;Low-frequencyengineering;Qualityassessment;Qualityassessmentsystems;Radiofrequencies;Ratings;Semiconductordevices;Semiconductors;Specification(approval);Testingconditions;Transistors
【摘要】:Ratings,characteristicsandinspectionrequirementswhichshallbeincludedasmandatoryrequirementsinaccordancewithBSQC750100.
【中国标准分类号】:L42
【国际标准分类号】:31_080_30
【页数】:32P.;A4
【正文语种】:英语