IEC 62525-2007 数字试验矢量数据用标准试验接口语言(STIL)
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【英文标准名称】:StandardTestInterfaceLanguage(STIL)fordigitaltestvectordata
【原文标准名称】:数字试验矢量数据用标准试验接口语言(STIL)
【标准号】:IEC62525-2007
【标准状态】:现行
【国别】:国际
【发布日期】:2007-11
【实施或试行日期】:
【发布单位】:国际电工委员会(IEC)
【起草单位】:IEC/TC93
【标准类型】:()
【标准水平】:()
【中文主题词】:自动化;电脑辅助工程;电脑软件辅助工程;数据处理;定义;数字的;信息交流;信息技术;接口;自我检查;自我测试;试验类型;试验程序;测试;测试设备;向量(数学)
【英文主题词】:Automation;CAE;CASE;Computeraidedengineering;Computeraidedsoftwareengineering;Datahandling;Dataprocessing;Definition;Definitions;Digital;Informationinterchange;Informationtechnology;Interfaces;Self-checking;Self-testing;Testpattern;Testprocedures;Testing;Testingdevices;Vectors(mathematics)
【摘要】:Thisstandarddefinesatestdescriptionlanguagethat:a)FacilitatesthetransferoflargevolumesofdigitaltestvectordatafromCAEenvironmentstoautomatedtestequipment(ATE)environments;b)Specifiespattern,format,andtiminginformationsufficienttodefinetheapplicationofdigitaltestvectorstoadeviceundertest(DUT);c)Supportsthevolumeoftestvectordatageneratedfromstructuredtestssuchasscan/automatictestpatterngeneration(ATPG),integraltesttechniquessuchasbuilt-inselftest(BIST),andfunctionaltestspecificationsforICdesignsandtheirassemblies,inaformatoptimizedforapplicationinATEenvironments.Insettingthescopeforanystandard,someissuesaredefinedtonotbepertinenttotheinitialproject.Thefollowingisapartiallistofissuesthatweredroppedfromthescopeofthisinitialproject:—Levels:Akeyaspectofadigitaltestprogramistheabilitytoestablishvoltageandcurrentparameters(levels)forsignalsundertest.Levelhandlingisnotexplicitlydefinedinthecurrentstandard,asthisinformationisbothcompact(notpresentingatransportationissue)andcommonlyestablishedindependentlyofdigitaltestdata,requiringdifferentsupportmechanismsoutsidethecurrentscopeofthisstandard.Terminationvaluesmayaffectlevels.—Diagnostic/fault-tracinginformation:ThegoalofthisstandardistooptimallypresentdatathatneedstobemovedontoATE.Whilediagnosticdata,faultidentificationdata,andmacro/designelementcorrespondencedatacanfallintothiscategory(andisoftenfairlylarge),thisstandardisalsofocusedonintegratedcircuitandassembliestest,andmostdebug/failureanalysisoccursseparatelyfromtheATEforthesestructures.Notethatreturnoffailureinformation(foroff-ATEanalysis)isalsonotpartofthestandardascurrentlydefined.—Dataloggingmechanisms,formatting,andcontrolusuallyarenotdefinedaspartofthiscurrentstandard.—Parametrictestsarenotdefinedasanintegralpartofthisstandard,exceptforoptionalpatternlabelsthatidentifypotentiallocationsforparametrictests,suchasIDDQtestsoralternatingcurrent(AC)timingtests.—Programflow:Testsequencingandorderingarenotdefinedaspartofthecurrentstandardexceptasnecessarytodefinecollectionsofdigitalpatternsmeanttoexecuteasaunit.—Binningconstructsarenotpartofthecurrentstandard.—Analogormixed-signaltest:Whilethisisanareaofconcernformanyparticipants,atthispointtransferofanalogtestdatadoesnotcontributetothesametransportationissueseenwithdigitaldata.—Algorithmicpatternconstructs(suchassequencescommonlyusedformemorytest)arenotcurrentlydefinedaspartofthestandard.—Paralleltest/multisitetestconstructsarenotanintegralpartofthecurrentenvironment.—Userinputandusercontrol/optionsarenotpartofthecurrentstandard.—Characterizationtools,suchasshmooplots,arenotdefinedaspartofthecurrentstandard.
【中国标准分类号】:L74
【国际标准分类号】:25_040;19_080
【页数】:146P.;A4
【正文语种】:英语
【原文标准名称】:数字试验矢量数据用标准试验接口语言(STIL)
【标准号】:IEC62525-2007
【标准状态】:现行
【国别】:国际
【发布日期】:2007-11
【实施或试行日期】:
【发布单位】:国际电工委员会(IEC)
【起草单位】:IEC/TC93
【标准类型】:()
【标准水平】:()
【中文主题词】:自动化;电脑辅助工程;电脑软件辅助工程;数据处理;定义;数字的;信息交流;信息技术;接口;自我检查;自我测试;试验类型;试验程序;测试;测试设备;向量(数学)
【英文主题词】:Automation;CAE;CASE;Computeraidedengineering;Computeraidedsoftwareengineering;Datahandling;Dataprocessing;Definition;Definitions;Digital;Informationinterchange;Informationtechnology;Interfaces;Self-checking;Self-testing;Testpattern;Testprocedures;Testing;Testingdevices;Vectors(mathematics)
【摘要】:Thisstandarddefinesatestdescriptionlanguagethat:a)FacilitatesthetransferoflargevolumesofdigitaltestvectordatafromCAEenvironmentstoautomatedtestequipment(ATE)environments;b)Specifiespattern,format,andtiminginformationsufficienttodefinetheapplicationofdigitaltestvectorstoadeviceundertest(DUT);c)Supportsthevolumeoftestvectordatageneratedfromstructuredtestssuchasscan/automatictestpatterngeneration(ATPG),integraltesttechniquessuchasbuilt-inselftest(BIST),andfunctionaltestspecificationsforICdesignsandtheirassemblies,inaformatoptimizedforapplicationinATEenvironments.Insettingthescopeforanystandard,someissuesaredefinedtonotbepertinenttotheinitialproject.Thefollowingisapartiallistofissuesthatweredroppedfromthescopeofthisinitialproject:—Levels:Akeyaspectofadigitaltestprogramistheabilitytoestablishvoltageandcurrentparameters(levels)forsignalsundertest.Levelhandlingisnotexplicitlydefinedinthecurrentstandard,asthisinformationisbothcompact(notpresentingatransportationissue)andcommonlyestablishedindependentlyofdigitaltestdata,requiringdifferentsupportmechanismsoutsidethecurrentscopeofthisstandard.Terminationvaluesmayaffectlevels.—Diagnostic/fault-tracinginformation:ThegoalofthisstandardistooptimallypresentdatathatneedstobemovedontoATE.Whilediagnosticdata,faultidentificationdata,andmacro/designelementcorrespondencedatacanfallintothiscategory(andisoftenfairlylarge),thisstandardisalsofocusedonintegratedcircuitandassembliestest,andmostdebug/failureanalysisoccursseparatelyfromtheATEforthesestructures.Notethatreturnoffailureinformation(foroff-ATEanalysis)isalsonotpartofthestandardascurrentlydefined.—Dataloggingmechanisms,formatting,andcontrolusuallyarenotdefinedaspartofthiscurrentstandard.—Parametrictestsarenotdefinedasanintegralpartofthisstandard,exceptforoptionalpatternlabelsthatidentifypotentiallocationsforparametrictests,suchasIDDQtestsoralternatingcurrent(AC)timingtests.—Programflow:Testsequencingandorderingarenotdefinedaspartofthecurrentstandardexceptasnecessarytodefinecollectionsofdigitalpatternsmeanttoexecuteasaunit.—Binningconstructsarenotpartofthecurrentstandard.—Analogormixed-signaltest:Whilethisisanareaofconcernformanyparticipants,atthispointtransferofanalogtestdatadoesnotcontributetothesametransportationissueseenwithdigitaldata.—Algorithmicpatternconstructs(suchassequencescommonlyusedformemorytest)arenotcurrentlydefinedaspartofthestandard.—Paralleltest/multisitetestconstructsarenotanintegralpartofthecurrentenvironment.—Userinputandusercontrol/optionsarenotpartofthecurrentstandard.—Characterizationtools,suchasshmooplots,arenotdefinedaspartofthecurrentstandard.
【中国标准分类号】:L74
【国际标准分类号】:25_040;19_080
【页数】:146P.;A4
【正文语种】:英语
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