MIL-PRF-38535G, PERFORMANCE SPECIFICATION: INTEGRATED CIRCUITS (MICROCIRCUITS) MANUFACTURING, GENERAL SPECIFICATION FOR (10 MAR 2006)., This specification establishes the general performance requirements for integrated circuits or microcircuits and the quality and reliability assurance requirements, which are to be met for their acquisition. The intent of this specification is to allow the device manufacturer the flexibility to implement best commercial practices to the maximum extent possible while still providing product that meets military performance needs. Detail requirements, specific characteristics of microcircuits, and other provisions which are sensitive to the particular use intended will be specified in the device specification. Quality assurance requirements outlined herein are for all microcircuits built on a manufacturing line which is controlled through a manufacturer's quality management (QM) program and has been certified and qualified in accordance with requirements herein. Several levels of product assurance including RHA are provided for in this specification. The certification and qualification sections found herein outline the requirements to be met by a manufacturer to be listed on a Qualified Manufacturer Listing (QML). After listing of a technology flow on a QML, the manufacturer is to continually meet or improve the established baseline of certified and qualified procedures, the QM program, the manufacturer's review system, the status reporting, and quality and reliability assurance requirements for all QML products. The manufacturer may present alternate methods of addressing the requirements contained in this specification. This specification requires a manufacturer to establish a process flow baseline. If sufficient quality and reliability data is available, the manufacturer, through the QM program and the manufacturer's review system, may modify, substitute, or delete tests. Class T is not for use in National Aeronautics and Space Administration (NASA) manned, satellite, or launch vehicle programs without written permission from the applicable NASA project office (i.e., cognizant electrical, electronic, and electromechanical (EEE) parts authority).【英文标准名称】:Formatguideandtestprocedureforsingle-axislasergyros
【原文标准名称】:单轴激光陀螺规格导则和试验规程
【标准号】:IEEE647-2006
【标准状态】:现行
【国别】:美国
【发布日期】:2006
【实施或试行日期】:
【发布单位】:美国电气电子工程师学会(IEEE)
【起草单位】:IEEE
【标准类型】:()
【标准水平】:()
【中文主题词】:航空航天运输;旋转轴;组件;电气工程;电子工程;激光束;激光工程;激光器;光电子学;光电器件;质量保证;规范;规范(验收);试验;试验条件
【英文主题词】:
【摘要】:
【中国标准分类号】:A52
【国际标准分类号】:31_260
【页数】:95P;A4
【正文语种】:英语